Atomic-force Microscopy and Its Applications
Ta¿ski, Tomasz / Staszuk, Marcin / Ziebowicz, Boguslaw
Atomic force microscopy is a surface analytical technique used in air, liquids or a vacuum to generate very high-resolution topographic images of a surface, down to atomic resolution. This book is not only for students but also for professional engineers who are working in the industry as well as specialists. This book aims to provide the reader with a comprehensive overview of the new trends, research results and development of atomic force m...